Intermolecular force

Results: 216



#Item
61Supramolecular chemistry / Helices / Force spectroscopy / DNA / Nucleic acid double helix / Hydrogen bond / Atomic force microscopy / Host-guest chemistry / Properties of water / Chemistry / Spectroscopy / Intermolecular forces

PDF Document

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Source URL: cancer-insights.asu.edu

Language: English - Date: 2013-03-04 16:47:44
62Covalent bond / Chemical polarity / Ionic bond / Hydrogen bond / Molecule / Molecular orbital / Orbital hybridisation / Intermolecular force / Ionic compound / Chemistry / Chemical bonding / Chemical bond

Chemistry Lesson 3  Atoms and Molecules Learning Objectives:  In this chapter you will learn:  Ÿ 

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Source URL: resources.edb.gov.hk

Language: English - Date: 2010-12-12 22:55:52
63Intermolecular forces / Molecular physics / Molecular dynamics / BOSS / Force field / OPLS / PM3 / Molecular mechanics / Solution / Chemistry / Computational chemistry / Molecular modelling

BOSS, Version 4.6 Biochemical and Organic Simulation System User’s Manual for UNIX, Linux, and Windows William L. Jorgensen

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Source URL: www.cemcomco.com

Language: English - Date: 2005-02-25 13:57:41
64Condensed matter physics / Colloidal chemistry / Soft matter / Dosage forms / Intermolecular forces / Atomic force microscopy / Drop / Emulsion / Microscopy / Chemistry / Matter / Science

LETTER pubs.acs.org/JPCL Combined AFMConfocal Microscopy of Oil Droplets: Absolute Separations and Forces in Nanofilms Rico F. Tabor,†,‡ Hannah Lockie,†,‡ Douglas Mair,§ Rogerio Manica,^ Derek Y. C. Chan,‡,#,

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Source URL: www.ms.unimelb.edu.au

Language: English - Date: 2011-04-08 22:33:03
65Covalent bond / Chemical polarity / Ionic bond / Hydrogen bond / Molecule / Molecular orbital / Orbital hybridisation / Metalloid / Intermolecular force / Chemistry / Chemical bonding / Chemical bond

DOC Document

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Source URL: resources.edb.gov.hk

Language: English - Date: 2010-12-12 22:55:48
66Microscopes / Chemistry / Scanning tunneling microscope / Intermolecular forces / Atomic force microscopy / Microscopy / Canton of Neuchâtel / Conductive atomic force microscopy / NanoWorld / Scanning probe microscopy / Science / Scientific method

Microsoft PowerPoint - ENGS-AFM [Compatibility Mode]

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Source URL: nanofab.caltech.edu

Language: English - Date: 2013-01-21 22:21:44
67Semiconductor devices / Emerging technologies / Quantum electronics / Scanning probe microscopy / Intermolecular forces / Atomic force microscopy / Silicon dioxide / Quantum dot / Annealing / Chemistry / Technology / Materials science

Contribution for Quantsol 2011 Winter Workshop Correlation between conductivity and structural evolution of Si-rich silicon oxide films annealed at different temperatures Bert Stegemann1, Thomas Lussky2, Andreas Schöpk

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Source URL: www.quantsol.org

Language: English - Date: 2011-03-17 17:06:50
68Computational chemistry / Molecular physics / Spectroscopy / Intermolecular forces / Molecular vibration / Molecule / Force field / Scaling / Z-matrix / Chemistry / Science / Molecular modelling

INPUT DESCRIPTION FOR SQM version 1.0 INTRODUCTION SQM is an add-on module for the PQS program which scales force constants to produce a Scaled Quantum Mechanical (SQM) Force Field. This can correct for deficiencies in t

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Source URL: www.pqs-chem.com

Language: English - Date: 2007-03-14 13:38:53
69Intermolecular forces / Chemistry / Atomic force microscopy / Nanotechnology / Park Systems / Scanning electron microscope / Nanometrology / Vibrational analysis with scanning probe microscopy / Magnetic force microscope / Scientific method / Science / Scanning probe microscopy

Nanotechnology Solutions Partner Park Systems Singapore. 33, Ubi Avenue 3, #07-47 Vertex Tower A SingaporeTel: +Mobile: +www.parkAFM.com © 2011 Park Systems Corp. All rights reserved.

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Source URL: www.nanowerk.com

Language: English - Date: 2011-11-12 18:00:00
70Chemistry / Intermolecular forces / Atomic force microscopy / Park Systems / Microscopy / Image scanner / Vibrational analysis with scanning probe microscopy / NanoWorld / Science / Scientific method / Scanning probe microscopy

Critical Dimensions Measurement of High Aspect Ratio Trench with XE AFM >>> Figure 1. (a) XE Scan System separates the Z-scanner from

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Source URL: www.nanowerk.com

Language: English - Date: 2011-11-12 18:00:00
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